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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
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Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
TOPAS
This course is intended for users of profile analysis and Rietveld refinement by using the fundamental parameter approach. The course goals are to impart knowledge of the method as well as to gain practical experience in handling the X-ray diffractometer. The main focus is on using the DIFFRACplus TOPAS software package. Lectures, demonstrations, and individual training at the PC will allow for independent practical work. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course.
The course TOPAS allows to combine the courses TOPAS Profile and TOPAS Structure Solution or TOPAS Profile and TOPAS Quantification Analysis. Please specify the combination you are interested in and mention the same during registration process!
| Part Number | Location | Dates | Deadline | Language | |
| 7KP18018BF |
Karlsruhe |
Apr 23-27 Sep 17-21 Oct 15-19 Dec 10-14 |
English English German English |
||
Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.
