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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Lab Report XRF 103 - S2 RANGER with XFlash LE and GEO-QUANT M
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Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Thin Film Analysis
This course is intended for users of thin film analysis, to impart fundamental knowledge of the method, consisting of reflectometry, high resolution and grazing incidence diffraction, as well as to gain practical experience in using the X-ray diffractometer. The main focus is on using the D8 DISCOVER MR (Material Research) and the DIFFRACplus LEPTOS software. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course. The training will be held in English.
| Part Number | Location | Dates | Deadline | Language | |
| 7KP18018DB |
Karlsruhe |
Mar 26-30 Aug 06-10 |
English English |
||
Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.
