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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Lab Report XRF 103 - S2 RANGER with XFlash LE and GEO-QUANT M
- Bruker Announces Advanced G4 ICARUS Combustion Gas Analyzer for Metal Foundry and Heat Treatment Applications
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
STRESS
This course is intended for users of X-ray residual stress analysis. The course goals are to impart fundamental knowledge of the method as well as to gain practical experience in handling the X-ray diffractometer. The main focus is on using the DIFFRACplus LEPTOS S software package. Lectures, demonstrations, and individual training at the PC will allow for independent practical work. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course. The training will be held in English.
| Part Number | Location | Dates | Deadline | Language | |
| 7KP18018BM | Karlsruhe | Jul 30-31 | Jun 30 | English | |
Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.
