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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Introduces the Alloy Guide App for Mobile Devices
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Lab Report XRF 103 - S2 RANGER with XFlash LE and GEO-QUANT M
- Lab Report XRF 104 - S8 TIGER with PETRO-QUANT
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
SPECTRAplus and SPECTRA EDX – X-ray fluorescence analysis (XRF) the easy way
Easy to use in daily routine, a maximum of intelligent analytical support, highly flexible even for most demanding applications: High performance X-ray fluorescence analysis (XRF) is made easy with SPECTRAplus and SPECTRA EDX. The complete software packages for qualitative, standardless and quantitative analysis offering all the benefits of the modern software operation from fast point-and-click operation to real multitasking. The standardized look-and-feel as well as the extensive help files make it easy to use from the very beginning: Simple and fast operation with minimal training required.
The integrated "Daily-Check-Routine" of SPECTRAplus and SPECTRA EDX is the base for simple periodical instrument checks according to GLP (Good Laboratory Practice).
Standardless Analysis by X-ray fluorescence (XRF) – Totally integrated for a maximum of analytical support
Standardless analysis –the major advantages of X-ray fluorescence analysis (XRF) - allows the fast and easy determination of the chemical composition without performing a calibration. Due to powerful matrix correction based on variable alphas every kind of sample can be analyzed with optimized measurement parameters for the chemical composition, no matter which kind of sample preparation has been used. Standardless Analysis with SPECTRAplus and SPECTRA EDX is flexible: Setting the analytical goal it allows quick determination with fast scan mode or improved accuracy and precision for later interactive evaluation.
In SPECTRAplus and SPECTRA EDX the standardless calibration is totally integrated for a maximum of analytical support: Optimized measurement conditions are provided for every single element, recommended line overlays and overlay factors are available. The most important advantage is that standardless calibration parameters can be integrated in user specific calibrations to expand dedicated methods for elements where no standards are available: A maximum of flexibility.

