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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
NANOS Specifications
| Scan range | 20 µm x 20 µm x 3 µm, 40 µm x 40 µm x 4 µm, 80 µm x 80 µm x 5 µm, hardware linearized scan, motion in X-Y-direction (optional in Z-direction) |
| Noise level | depending on optical microscope, typ. better than 1 nm in acoustic enclosure |
| Lateral accuracy | typically within 1%, closed loop scanning |
| Scan speed | typ. 1 to 10 Hz |
| Detection principle | fiber optic interferometry, noise level < 0.01 nm RMS |
| Tips | silicon tips, various types |
| Tip change | adjustment free |
| Digital input resolution | 16 bit A/D |
| Digital output resolution | 16 bit D/A |
| Output voltage | ± 165 V, 2 µV RMS |
| Input channels | max. 8 simultaneous |
| Exteral inputs | max. 3 high speed with 16 bit resolution |
| Image size | freely selectable, from 128 to 1024 pixels, also rectangular sizes |
| Processing | internal 32 bit DSP, typ. 50 MHz |
| Computer interface | USB (standard universal serial bus) |
| Operating system | MS-Windows 2000®, XP |

