Atomic Force Microscopy

NANOS Specifications

   
Scan range 20 µm x 20 µm x 3 µm, 40 µm x 40 µm x 4 µm, 80 µm x 80 µm x 5 µm, hardware linearized scan, motion in X-Y-direction (optional in Z-direction)
Noise level depending on optical microscope, typ. better than 1 nm in acoustic enclosure
Lateral accuracy typically within 1%, closed loop scanning
Scan speed typ. 1 to 10 Hz
Detection principle fiber optic interferometry, noise level < 0.01 nm RMS
Tips silicon tips, various types
Tip change adjustment free
Digital input resolution 16 bit A/D
Digital output resolution 16 bit D/A
Output voltage ± 165 V, 2 µV RMS
Input channels max. 8 simultaneous
Exteral inputs max. 3 high speed with 16 bit resolution
Image size freely selectable, from 128 to 1024 pixels, also rectangular sizes
Processing internal 32 bit DSP, typ. 50 MHz
Computer interface USB (standard universal serial bus)
Operating system MS-Windows 2000®, XP