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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
- Bruker Announces $10M in New Orders for Novel Metrology Tools from Leading Semiconductor Manufacturer
- Bruker AXS in Karlsruhe has new phone numbers
- Application Report XRD 12 - D8 FABLINE
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
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LAB Tools
- D8 DISCOVER
The D8 DISCOVER is the recommended diffraction solution system for X-ray metrology in an R&D environment. The instrument can be optimized to meet all your experimental demands.
The D8 DISCOVER includes a whole set of unique advantages like for instance third generation Göbel Mirrors, a system designed for easy and failsafe operation and shortest measurement times due to Ultra GID for nanometer layers and the VÅNTEC-1 detector.
