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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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GADDS
This basic course is intended for practical work with the 2D detector and the GADDS software. The course goals are to impart the know-how required for
getting the best information from your X-ray data. Various specialised applications and measurement methods like microdiffraction, stress/texture and automation routines will be discussed in detail. Lectures, demonstrations, and intensive individual training on the GADDS system will allow for independent practical work. Furthermore, you are encouraged to bring your questions, problems, practical examples, and experiences to the course. The training will be held in English.
| Part Number | Location | Dates | Deadline | Language | |
| 7KP18018BH | Karlsruhe | Oct 18-22 | Sep 20 | in English | |
Good knowledge of English is necessary. The number of participants is limited to a minimum of 3 participants. The course price includes course materials, lunch and refreshments. Travel and accommodation are not included. For cancellation within 10 working days before the start of the course, we will charge a cancellation fee of 30 %. Booked persons not attending the course without having given prior notice will be fully charged. To register, fill out the following registration form.