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- ACS Fall
Aug 22-26, Boston, Massachusetts, USA - 3rd EuCheMS Chemistry Congress
Aug 29-Sep 02, Nuremberg, Germany - 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
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Sep 20-22, Karlsruhe, Germany
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D2 CRYSO – The new X-Ray Diffraction Solution
- D2 CRYSO
The new D2 CRYSO diffraction solution is a unique bench-top crystal orientation analyzer utilizing a novel, patented method of energy dispersive X-ray Diffraction (ED-XRD). Bruker’s D2 CRYSO is an ideal tool for the determination of lattice orientations of medium and large single crystals that is required for growing and processing single crystal materials.
The D2 CRYSO is equipped with the leading 30 mm2 XFlash® silicone-drift (SDD) detector and a high brilliance micro focus x-ray source. This combination offers outstanding energy resolution and speed, and requires no cooling water.
General measuring principle of the D2 CRYSO
- Measuring principle
The primary 'white' beam (grey) impinges on the single crystal sample with lattice planes oriented at an angle with respect to the surface of the crystal. The direction of the diffracted 'monochromatic' beam (blue) off the scattering planes (green) is defined by the Laue condition, k - k' = G, with k and k' are the wave vectors of the incident and diffracted beam, and G is a reciprocal space vector.