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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
DIFFRACplus BASIC Measurement Package
The BASIC Measurement Package offers an convenient and flexible control and navigation center for your daily diffraction work. The user interfaces are the XRD Commander and the XRD Wizard constituting an innovative measurement basis for X-ray diffraction applications.
- User friendliness - both programs offer alternatively graphical or structured user input
- Mobility and convenience - the operator can control the diffraction system from any computer via a network connection
- Flexibility - up to sixteen software-controlled drives can be integrated into the diffraction setup
- Individuality - the software tracks the user's last settings and proposes these for the next measurements
- Automation - all routine work can simply be automated by using Visual BasicTM scripts
- Ease of use - complex control operations are simplified to one-button operation
- Simplification - graphical views are used for setting up sophisticated measurements like temperature profiles or reciprocal spacemaps
New: XRDWizard V2.9
The new XRDWizard V2.9 now supports Variable Counting Time (VCT), a data collection scheme for X-ray powder diffraction, where the measurement time is systematically increased towards higher angles 2theta. As a result the natural steep intensity fall towards higher angles 2theta is compensated, leading to drastically improved data quality for all kinds of profile fitting applications.
Generally, with VCT full advantage can be taken of the substantial amount of peak information present at higher angles 2theta, which is otherwise lost in conventional constant counting time measurements.
