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- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
- Testimonial for Dr. Bruce Kaiser's Hands-on workshop: Accurate Elemental Non-destructive XRF
- Bruker Elemental announces the winner of our S1 Sorter giveaway contest
- S1 SORTER testimonial from TP Consulting Services
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
Tracer Applications Experts
- Dr. Bruce J. Kaiser, Chief Scientist, Bruker Elemental
Bruker Handheld has a staff of applications experts who are ready to provide training and respond to your applications needs and questions. The staff includes members who have over 50 years of experience in the application of XRF in University and Museum settings.
Over the past decade they have given over 300 workshops in Museums and Universities around the world and installed Tracer systems in over 175 Museums and Universities including many world class institutions. The staff has a very broad and deep technical knowledge of the challenges facing curators and conservators of very diverse collections and materials and is currently actively working on several applications.
Our staff, in addition to providing applications support to this growing network of Universities and Museums, has authored numerous patents and technical papers. They are also included on the faculty of several well known short courses on the application of XRF in museums, research and teaching.