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- Bruker Introduces Novel TERS-Ready AFM System
- Bruker Completes Acquisition of Center for Tribology, Inc.
- Bruker Announces Agreement to Acquire CETR
- Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
- Bruker Announces New Website and Online Store for AFM Probes
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
AFM Features - NANOS AFM / SPM products
- The compact NANOS AFM
Bruker Nano supplies AFMs/SPMs that
- provide fast and easy navigation
- can be operated by users with introductory training only, yet offer all modes and options required for advanced research
- use fiber optic interferometry for calibrated cantilever deflection measurements
- cover the range from large scan areas (combined with traceable AFM (optional)) to highest resolution
- can be upgraded with other techniques, e.g. Raman, confocal microscopy
- can be combined with your existing optical/confocal/interferometric microscope, or similar inspection tools
- are available in versions for samples up to 300 mm diameter
In short, we have the right solution for your SPM application!
